Nicolson–Ross–Weir method

The method uses scattering parameters of a material sample embedded in a waveguide, namely ${\displaystyle S_{11}}$ and ${\displaystyle S_{21}}$, to calculate permittivity and permeability data. ${\displaystyle S_{11}}$ and ${\displaystyle S_{21}}$ correspond to the cumulative reflection and transmission coefficient of the sample that are referenced to the each sample end, respectively: these parameters account for the multiple internal reflections inside the sample, which is considered to have a thickness of ${\displaystyle d}$. The reflection coefficient of the bulk sample is:[1][2]

${\displaystyle \Gamma =X\pm {\sqrt {X^{2}-1}}}$

where

${\displaystyle X={\frac {1-(S_{21}^{2}-S_{11}^{2})}{2S_{11}}}}$

The sign of the root for the reflection coefficient is chosen appropriately to ensure its passivity (${\displaystyle |\Gamma |\leq 1}$). Similarly, the transmission coefficient of the bulk sample can be written as:

${\displaystyle T={\frac {S_{11}+S_{21}-\Gamma }{1-(S_{11}+S_{21})\Gamma }}}$

Thus, the effective permeability (${\displaystyle \mu ^{*}}$) and permittivity (${\displaystyle \varepsilon ^{*}}$) of the material can be written as:

${\displaystyle \mu ^{*}={\frac {\lambda _{0g}}{\Lambda }}\left({\frac {1+\Gamma }{1-\Gamma }}\right)}$

${\displaystyle \varepsilon ^{*}={\frac {\lambda _{0}^{2}\left({\frac {1}{\Lambda ^{2}}}+{\frac {1}{\lambda _{c}^{2}}}\right)}{\mu ^{*}}}}$

where

${\displaystyle {\frac {1}{\Lambda ^{2}}}=-\left[{\frac {1}{2\pi d}}ln{\frac {1}{T}}\right]^{2}}$

and

• ${\displaystyle \lambda _{0}}$ is the free-space wavelength.
• ${\displaystyle \lambda _{0g}}$ is the guided mode wavelength of the unfilled transmission line.
• ${\displaystyle \lambda _{c}}$ is the cutoff wavelength of the unfilled transmission line

The constitutive relation for ${\displaystyle \Lambda }$ admits an infinite number of solutions due to the branches of the complex logarithm. The ambiguity regarding its result can be resolved by taking the group delay into account.[2]

In the case of low material loss, the Nicolson–Ross–Weir method is known to be unstable for sample thicknesses at integer multiples of one half wavelength due to resonance phenomenon. Improvements over the standard algorithm have been presented in engineering literature to alleviate this effect.[4][5][6] Furthermore, complete filling of a waveguide with sample material may pose a particular challenge: presence of gaps during the filling of the waveguide section would excite higher-order modes, which may yield errors in scattering parameter results.[7] In such cases, more advanced methods based on the rigorous modal analysis of partially-filled waveguides[8][9] or optimization methods[10] can be used. A modification of the method for single-port measurements was also reported.[11]

In addition to homogenous materials, the extension of the method was developed to obtain constitutive parameters of isotropic and bianisotropic metamaterials.[12][13][14]

• Fourier-transform spectroscopy
• Microwave radiometer
• Reflection seismology
• Spectroscopy
• Time-domain reflectometer
• Vector network analyzer

• Chen, L. F.; Ong, C. K.; Neo, C. P.; Varadan, V. V.; Varadan, V. K. (2004). Microwave electronics: measurement and materials characterization. John Wiley & Sons. ISBN 9780470020456.