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X-Ray Diffraction Analysis
![Structure determination by X-ray crystallography](../../../../../../../../../figures.boundless-cdn.com/11219/full/x-ray-diffraction.jpg)
Structure determination by X-ray crystallography
X-ray diffraction analysis workflow. In an X-ray diffraction measurement, a crystal is mounted on a goniometer and gradually rotated while being bombarded with X-rays, producing a diffraction pattern of regularly spaced spots known as reflections. The two-dimensional images taken at different rotations are converted into a three-dimensional model of the density of electrons within the crystal using the mathematical method of Fourier transforms, combined with chemical data known for the sample.
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